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OESW - Single-Wire/Single-Slit Diffraction
 
   
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OESW - Single-Wire/Single-Slit Diffraction

  • Product Code:OESW
  • Item:OESW
  • Sales Price:
  • PDF document: OESW
Description:

This system is designed to observe single-wire/single-slit diffraction, measure intensity distribution of diffraction, verify the relationships between intensity and wavelength/slit width, and acknowledgeHeisenberg uncertainty and Babinet's principles.

Please contactsales@oelabs.com for more information.

What you can learn about:
  1. Observe single-wire/single-slit diffraction
  2. Measure intensity distribution of optical diffraction
  3. Confirm the relationship between intensity and wavelength
  4. Obtain the relationship between intensity and slit width
  5. Verify Heisenberg uncertainty and Babinet's principles

Part list and specifications:

Item

Description

specification

Qty

1

Semiconductor Laser

5mW

1

2

Optical Rail (1)

Common

1

 

Optical Rail(2)

Lateral adjustment

1

3

Adjusting frame

Transverse Measurement Holder、Single-Slit with Adjustable Width 、Two-Axis Adjustable Laser Holder

 

4

Photoreceiver with Amplifier

Silicon photocell

1

5

others

White Screen、optical rail(1m)

 

If you have any questions on this product, please ask advice!

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